Attached files
file | filename |
---|---|
8-K - CURRENT REPORT - AEHR TEST SYSTEMS | aehr_8k.htm |
Exhibit 99.1
Contacts:
Aehr
Test Systems
|
MKR
Investor Relations Inc.
|
Ken
Spink
|
Todd Kehrli or Jim
Byers
|
Chief Financial
Officer
|
Analyst/Investor
Contact
|
(510) 623-9400
x309
|
(323)
468-2300
|
|
aehr@mkr-group.com
|
Aehr Test Systems announces changes to its Board of
Directors
Fremont, CA (September 9, 2020) – Aehr Test Systems (NASDAQ:
AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has appointed Geoff Scott to
its board of directors, effective September 2, 2020. The
Company also announced John Schneider, who has served on the Aehr
Test Systems board since 2014, has resigned for personal reasons
effective September 2, 2020. The
number of Aehr Test board members remains at
six.
"Geoff
brings a background of both corporate finance and Board level
engagement. As an investor in emerging high growth companies, his
experience will be a valuable addition as we continue to focus on
the many expanding opportunities for the Company. I would also like
to take this opportunity to thank John for more than 5 years of
service, support and belief in Aehr Test Systems including
participation in our common stock offerings," said Gayn Erickson,
president and CEO.
Mr.
Scott came up through the corporate finance divisions of both Chase
Manhattan Bank, now JP Morgan Chase, and Merrill Lynch. For the
last 25 years, he has been President of Scott Asset Management,
whose clients invest primarily in small cap but industry leading
companies. He was a participant in two of Aehr Test's private
placements and continues to be a substantial shareholder. He
graduated from Dartmouth College with Degrees in Political Science
and Economics.
About Aehr Test Systems
Headquartered
in Fremont, California, Aehr Test Systems is a worldwide provider
of test systems for burning-in and testing logic, optical and
memory integrated circuits and has over 2,500 systems installed
worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, incremental capacity needs, and new
opportunities for Aehr Test products in package, wafer level, and
singulated die/module level test. Aehr Test has developed and
introduced several innovative products, including the
ABTSTM and
FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP
WaferPak Contactor, FOX DiePak® Carrier and FOX
DiePak Loader. The ABTS system is used in production and
qualification testing of packaged parts for both lower power and
higher power logic devices as well as all common types of memory
devices. The FOX-XP and FOX-NP systems are full wafer contact and
singulated die/module test and burn-in systems used for burn-in and
functional test of complex devices, such as leading-edge memories,
digital signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.